Higher Science
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Accessories
Optical Bench
A versatile and modular system that can be utilized across many experiments. The optical bench has three core parts: Rail, Mounts, and Uprights. All the core parts have been designed in such a way that they are suitable for multiple types of experiments.
KEY FEATURES
- Excellent stability and easy set-up of the optical bench – Mounts can be fixed to the rail by just aligning and sliding two screws into the rail and fastened. The uprights can be placed and fastened at any desired position with ease
- Height adjustable mounts – The optical bench is designed with three-point mounts, with two of their height adjustable and lockable with a range of 20 mm. The height adjustment gives precision in maintaining the horizontal axis of the bench. The mount bases are rubber padded to avoid sliding the optical bench on the lab benches.
- Anti-rotation square holders on the uprights (Patent Pending) – The optical bench uprights are designed with square holders and square shafts for holding accessories. One of the major needs in optical experiments is to maintain the alignment of accessories. More often, the accessory holder is susceptible to rotation. Square shafts ensure the anti-rotation of the accessories and make experimenting hassle-free. It also avoids any kind of lateral bend or movement of the accessories.
- All parts are scratch-resistant and the movement of uprights on the rail is seamless.
OB1 -
Experiments
Photoconductivity Experiment
Objectives
To study the photoconductivity of CdS Photoresistor, in the following conditions:
- Applied voltage vs photocurrent (IPH) at constant irradiance (Φ).
- Photocurrent (IPH) vs irradiance (Φ) at a constant applied voltage (V).
Principle
The phenomenon of photoconductivity occurs when an incident light shown upon a semiconductor causes an increase in its electrical conductivity. This is because of the excitation of electrons across the energy gap into the conduction band, which leads to an increase in the number of free carriers in the conduction band, hence, an increase in the conductivity of the semiconductor. Here, we can study the characteristics of the CdS photoresistor under different conditions of light intensity and applied voltage.
KEY FEATURES
- Precise Optical Alignment: The optical alignment of the components is attained by the optical bench, the set-up time is faster and experimentation is easy.
- Fine and Easy Light Intensity Adjustment: Light intensity adjustment is done via the use of two polarizers. This helps in easier and fine light intensity adjustments.
- Simple and Easy Connections: The color-coded terminals on the various components aid in the ease of connections thus reducing the setup time.
WHAT YOU NEED
- OB2 Optical Bench Set 0.4m 1
- HA001 Light Source Holder 1
- HA004 Polarizer Holder 1
- HA006 Analyzer Holder 1
- HA020 LDR Module Holder 1
- PH61022D/20 Power Supply, 0-15V, 200mA 1
- PH61022D/2 Power Supply for Light Source 1
- PCE1-C: Complete Equipment Set With Instruction Manual
PCE1-C -
Accessories
Energy Band Gap Apparatus
The energy band Gap Measuring Instrument is used to find the energy band gaps of the different semiconductor diodes and LEDs. The setup comes with a temperature meter, an in-built heating element with an ON/OFF toggle switch, and the following diodes and LEDs (IN4007, Germanium Diode, Green LED, and Blue LED) which can be selected by a rotary switch. Ammeter and voltmeter are connected externally to the instrument.
Specifications
Input Voltage – 12V DC
Current Rating – 5 A Max.
Heater Power – 40 Watt
Temperature Range- 0 – 110⁰CPH94002 -
Accessories
Planck Constant Apparatus
Planck’s Constant Measuring Instrument is used to determine Planck’s constant, “h” using LEDs. The setup comes with a voltmeter, temperature meter, a heating element with an ON/OFF toggle switch, and the following LEDs (Amber, Blue, Yellow, Red, and Green LED) which can be selected by a rotary switch. Ammeter can be connected externally to the instrument.
Specifications
Input Voltage – 12V DC.
Current Rating – 5 A Max.
Heater Power – 40 Watt.
Temperature Range- 0 – 110⁰C.PH94004 -
Experiments
Pin Diode Characteristics Experiment
OBJECTIVES
- To study the response of PIN diode, in the following conditions:
- Photocurrent (Iph) vs Applied voltage at constant irradiance (Φ) under Reverse biased condition of the PIN diode.
- Current (I) vs Voltage (V) under forward bias condition of the PIN diode.
PRINCIPLE
The PN-Junction diodes, though versatile, have a few limitations regarding the amount of current they could handle before breakdown and also have low switching frequency, low power handling capacity, and low quantum efficiency. To overcome all these issues PIN diode was designed. PIN diodes are also extensively used as photodiodes in PIN photodiode configuration and are very important in optical fiber communication.
KEY FEATURES
- Precise Optical Alignment: The optical alignment of the components is attained by the optical bench, the set-up time is faster and experimentation is easy.
- Fine and Easy Light Intensity Adjustment: Light intensity adjustment is done via the use of two polarizers. This helps in easier and fine light intensity adjustments.
- Simple and Easy Connections: The color-coded terminals on the various components aid in the ease of connections thus reducing the setup time.
WHAT YOU NEED
- OB2 Optical Bench Set 0.4m 1
- HA001 Light Source Holder 1
- HA004 Polarizer Holder 1
- HA006 Analyzer Holder 1
- HA021 Photodiode Module Holder 1
- PH64505 Multimeter 1
- PH61022D/2 Power Supply for Light Source 2
Complete Equipment Set with Instruction Manual from catalogue.
PIN1-C -
Experiments
Planck Constant Experiment
OBJECTIVES
To determine Planck’s constant using LED.
PRINCIPLE
KEY FEATURES- Built-In Heater: The heating element is built into the system and is powered by 12V input. The efficient heating mechanism heats the system to the required temperature in a few minutes with a minimum power requirement of 40W.
- Modular Design: The modular design of the setup allows the testing of different colored LED’s.
- Built-In Voltage and Temperature Probe: All the necessary parameters to be measured are available directly on the setup itself.
WHAT YOU NEED
PH94004 Planck Constant Apparatus 1 PH61035D/5 Power Supply 1 PH64505 Multimeter 1 AC026 Syringe, 20ml 1 AC028 Silicone Oil, 50ml 1 Complete Equipment Set with Instruction Manual from catalogue.
PLC1-C -
Experiments
Quinck’s Tube Experiment
Objectives
To measure the magnetic susceptibility of a given paramagnetic sample (FeCl3).
Principle
The Quinck’s method is used to determine magnetic susceptibility of diamagnetic or paramagnetic substances in the form of a liquid or an aqueous solution. When an object is placed in a magnetic field, a magnetic moment is induced in it. Magnetic susceptibility x is the ratio of the magnetization I (magnetic moment per unit volume) to the applied magnetizing field intensity H. The magnetic moment can be measured either by force methods, which involve the measurement of the force exerted on the sample by an inhomogeneous magnetic field or induction
methods where the voltage induced in an electrical circuit is measured by varying magnetic moment.Key Features
- Compact Setup – The apparatus design is compact and yet effective to perform the experiments with ease. The simple connections and stand to hold the teslameter probe, makes it easy to handle.
- Custom Quinck’s Tube – Specially designed quinck’s tube can be attached seamlessly on the setup and dimensions are controlled such that it fits perfectly between the pole pieces.
Equipments Needed for the Experiment
- PH94012 Electromagnet for Quinck’s Tube 1
- AC030 Quinck’s Tube 1
- PH61035D/7 Power Supply for Electromagnet 1
- PH93225G Teslameter, Digital 1
- PH30780 Vernier Microscope 1
QTE1-C -
Experiments
Quarter and Half Wave Plate Experiment
OBJECTIVES
To study the effect of wave plates on polarized light
- Quarter wave plate
- Half wave plate
PRINCIPLE
Waveplates are optical devices that resolve a light wave into two orthogonal linear polarization components by producing a phase shift between them. The transmitted light may have a different type of polarization than the incident beam due to the induced phase difference. Commonly used retarders are quarter-wave plates and half-wave plates. The quarter-wave plate is used to convert a linearly polarized input beam into a circular (or elliptical) polarized beam and vice-versa. Half-wave plate rotates the plane of polarization of linearly polarized light that is input on it by twice the angle between its optical axis and the initial orientation of the linearly polarized light.
KEY FEATURES
- Precise Optical Alignment: The optical alignment of the components is attained by the optical bench, the set-up time is faster and experimentation is easy.
- Digital Lux Meter: This enables the measurement of light intensity at various angles of reflection. The meter reads with a precision of 1 lux.
- Easy and accurate adjustments: The design of the setup helps in the easier rotation of wave plates without blocking the path of light. The least o count of 1 aid in accurate readings
WHAT YOU NEED
OB1 Optical Bench Set 0.8m 1 UP001 Upright 1 HA001 Light Source Holder 1 HA004 Polarizer Holder 1 HA006 Analyzer Holder 1 HA510 Light Sensor Holder 1 DP1 Data Processor 1 PH61022D/2 Power Supply for Light Source 1 HA030 Quarter Wave Plate Holder 1 HA031 Half Wave Plate Holder 1 Complete Equipment Set with Instruction Manual from catalogue.
QWP1-C -
Experiments
Size of Particle Experiment
OBJECTIVES
- To measure the width/thickness of the given samples by analyzing the diffraction pattern.
PRINCIPLE
The characteristics of light such as interference and diffraction can be understood when light is studied as a wave phenomenon. Interaction of waves with matter results in either transmission, reflection, absorption, or diffraction of the wave. When the size of the matter is comparable to the wavelength of the wave that it interacts with, a phenomenon called diffraction occurs. Diffraction of light due to particles is a function of the size of the particle and the wavelength of the light incident. It is possible to measure the size of a particle by studying the diffraction patterns created by it.
KEY FEATURES
- Easy Adjustable Laser: The multiple degrees of freedom on the laser mount helps in the effortless movement of the laser source. This helps in aligning the laser source with the sample quite easily.
- Laser Range Finder: The addition of a laser range finder allows the user to use any standard wall as a screen, increasing the distance between the screen and the sample. Thus, the diffraction pattern can be seen distinctly and thus increasing the accuracy of the readings.
- Multiple Samples can be Tested and Verified: The modular setup helps in measuring the diameters of different samples and other everyday objects as well.
WHAT YOU NEED
- OB1 Optical Bench Set 0.8m 1
- HA003 Laser Source Holder 1
- HA008 Grating Holder 1
- HA024 Screen Holder 1
- AC010 Laser Distance Meter 1
- AC018 Diffraction Grating 1
- AC012 Frame With Thread Type 1 1
- AC014 Frame With Thread Type 2 1
- AC016 Frame With Thread Type 3 1
Complete Equipment Set with Instruction Manual from catalogue.
SOP1-C -
Experiments
Single Slit Experiment
OBJECTIVES
- To find the wavelength of a given laser using the slit of known width.
- To find the slit width knowing the wavelength of light used.
- Proving the concept of the Heisenberg uncertainty principle.
PRINCIPLE
Diffraction is a phenomenon of bending of waves when it encounters obstacles or narrow opening. A basic setup to observe diffraction consists of a laser, a slit, screen placed at a distance. The wavefronts are partially obstructed by the slit. The intensity distribution of the diffraction pattern consists of a series of light and dark fringes with the intensity distribution symmetric along the central axis. The primary peak is called the central maxima. The corresponding peaks are called secondary, and tertiary maxima. This is studied using the single-slit experiment.
KEY FEATURES
- Precise Optical Alignment: The optical alignment of the components is attained by the optical bench, the set-up time is faster and experimentation is easy.
- Digital Lux Meter with Transverse Saddle: The digital Lux meter enables the measurement of light intensity. The transverse saddle helps in the fine movement of the Lux meter perpendicular to the direction of light.
WHAT YOU NEED
OB1 Optical Bench Set 0.8m 1 HA003 Laser Source Holder 1 HA012 Adjustable Collimating Slit Holder 1 HA512 Travelling Light Sensor Holder 1 DP1 Data Processor 1 PH61022D/2 Power Supply for Light Source 1 Complete Equipment Set with Instruction Manual from catalogue.
SSE1-C -
Accessories
Electromagnet Set Assembly
The Electromagnet set includes U core, pole pieces coils (x 2), and coils (x 2) mounted on two uprights.
Specifications:
- Coils
• 500 turns
• Current: 7A(Max.)
• Wire: 17 SWG, Copper
• Connections: 4mm safety socket - U Core
• 150 x 130mm (Lx H), 40 x 40mm cross-section - Pole Pieces
• Length = 75mm
• Material: Ferromagnetic
UP025 - Coils
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Accessories
Rotating Table Assembly
A simple, smooth, and compact rotating table. The rotating table used is extremely smooth to operate. It is a single assembly that holds a glass sample, analyzer, and light sensor, thus minimizing the size of the whole equipment. Smooth rotation makes measurement continuous and accurate.
UP030 -
Accessories
Telescope Assembly
The telescope on the rotating table is mounted with bearings for smooth rotation. The diffraction grating mounted is mounted at the center of the rotating table. The telescope is easy to focus on and operate. The angle of the rotating arm has a least count of 0.1° for accurate measurement of the spectral lines.
UP035 -
Accessories
Spectrum Tube Power Supply Assembly
The built-in power supply makes a more compact system with easier changing of the discharge tubes. Easy power connection and no unnecessary wire intrusions.
Specifications:
- Input Voltage: 220V, 50 Hz AC.
- Output Voltage: 0-5000V (open circuit).
- Socket: Spring loaded.
UP040
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